Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology

Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology

In semiconductor industry, cycle time of the wafer fabrication is very crucial and one of the contributing factors comes from wafer testing. This thesis presents the application of back propagation Artificial Neural Network (ANN) model designed to infer electrical test parameters from the given list...

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Main Author: Ke, Joseph Kian Seng
Format: Thesis
Published: 2005
Subjects:
QA76.75-76.765 Computer software
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spelling my-mmu-ep.12142010-08-19T08:19:21Z Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology 2005-03 Ke, Joseph Kian Seng QA76.75-76.765 Computer software In semiconductor industry, cycle time of the wafer fabrication is very crucial and one of the contributing factors comes from wafer testing. This thesis presents the application of back propagation Artificial Neural Network (ANN) model designed to infer electrical test parameters from the given list of parameters with the intention of reducing test time, to enhance throughput, and to improve cycle time. 2005-03 Thesis http://shdl.mmu.edu.my/1214/ http://myto.perpun.net.my/metoalogin/logina.php masters Multimedia University Research Library
institution Multimedia University
collection MMU Institutional Repository
topic QA76.75-76.765 Computer software
spellingShingle QA76.75-76.765 Computer software
Ke, Joseph Kian Seng
Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology
description In semiconductor industry, cycle time of the wafer fabrication is very crucial and one of the contributing factors comes from wafer testing. This thesis presents the application of back propagation Artificial Neural Network (ANN) model designed to infer electrical test parameters from the given list of parameters with the intention of reducing test time, to enhance throughput, and to improve cycle time.
format Thesis
qualification_level Master's degree
author Ke, Joseph Kian Seng
author_facet Ke, Joseph Kian Seng
author_sort Ke, Joseph Kian Seng
title Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology
title_short Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology
title_full Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology
title_fullStr Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology
title_full_unstemmed Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology
title_sort artificial neural network based prediction of electrical test parameters in wafer fabrication technology
granting_institution Multimedia University
granting_department Research Library
publishDate 2005
_version_ 1747829318316195840

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