Optimal modeling fill guide for improved interconnect performance
Chemical mechanical polishing (CMP) planarization process is an important step in fabrication for multi-layer metallization to create and design IC metallization and via interconnections. Fill synthesis methodologies are innovated by inserting dummy fill structures into the surrounding functional in...
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主要作者: | Yeo, Joel Yee Kiat |
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格式: | Thesis |
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2012
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