Low area Programmable Memory Built-In Self-Test (PMBIST) for small embedded ram cores / Nur Qamarina Mohd Noor

As latest trend in designing processors and system-on-chips (SoCs) requires more RAMs than logics, these embedded RAMs contribute to the high percentage of yields for these processors and SoCs. To ensure high percentage of yield is achieved, a builtin self-test (BIST) is utilized to test these RAMs....

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Bibliographic Details
Main Author: Mohd Noor, Nur Qamarina
Format: Thesis
Published: 2013
Online Access:https://ir.uitm.edu.my/id/eprint/15565/1/TM_NUR%20QAMARINA%20MOHD%20NOOR%20EE%2013_5.PDF
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