Low area Programmable Memory Built-In Self-Test (PMBIST) for small embedded ram cores / Nur Qamarina Mohd Noor
As latest trend in designing processors and system-on-chips (SoCs) requires more RAMs than logics, these embedded RAMs contribute to the high percentage of yields for these processors and SoCs. To ensure high percentage of yield is achieved, a builtin self-test (BIST) is utilized to test these RAMs....
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis |
| Language: | English |
| Published: |
2013
|
| Subjects: | |
| Online Access: | https://ir.uitm.edu.my/id/eprint/15565/1/TM_NUR%20QAMARINA%20MOHD%20NOOR%20EE%2013_5.PDF |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|