Improving on board integrated circuits testing using one shared test access port and single bidirectional test data line
Traditional test and measurement equipment that relies on connecting external probes is no longer possible given the state of the art of today’s shrinking printed circuit boards (PCBs). Since probing is extremely difficult, other methods must then be explored. A new and reliable approach for test...
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| Main Author: | |
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| Format: | Thesis |
| Language: | English |
| Published: |
2015
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| Subjects: | |
| Online Access: | http://ir.unimas.my/id/eprint/10800/1/Salim.pdf |
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