March-based diagnosis algorithm for static random-access memory stuck-at faults and transition faults
The fast growing of technologies has enabled the Static Random Access Memories (SRAMs) to contain higher density of cell array which make it prone to be affected by defects. This factor contributes to challenges faced in the area of memory testing. Functional test is a standard testing procedure to...
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| Main Author: | |
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| Format: | Thesis |
| Language: | English |
| Published: |
2012
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| Subjects: | |
| Online Access: | http://psasir.upm.edu.my/id/eprint/48472/1/FK%202012%20118R.pdf |
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