March-based diagnosis algorithm for static random-access memory stuck-at faults and transition faults
The fast growing of technologies has enabled the Static Random Access Memories (SRAMs) to contain higher density of cell array which make it prone to be affected by defects. This factor contributes to challenges faced in the area of memory testing. Functional test is a standard testing procedure to...
Saved in:
Main Author: | Mat Isa, Masnita |
---|---|
Format: | Thesis |
Language: | English |
Published: |
2012
|
Subjects: | |
Online Access: | http://psasir.upm.edu.my/id/eprint/48472/1/FK%202012%20118R.pdf |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Development of automated neighborhood pattern sensitive faults syndrome generator for static random access memory
by: Rusli, Julie Roslita
Published: (2011) -
Bit flipping effect on 6T, 7T and 10T static random access memory by TCAD simulation /
by: Mahmud, Manzar
Published: (2016) -
Single event psets on static random access memory by SPENVIS and PSPICE simulation at near equatorial orbits /
by: Mahammed, Souaad Ben Kara
Published: (2016) -
Vibrational frequencies of magnetic random access memory materials /
by: Lee, Li Ling
Published: (2010) -
Synthesis and characterization of perovskite-based materials for memory device application /
by: Thien, Gregory Soon How
Published: (2021)