Computer Simulation of Surface Plasmon Resonance for Optical Multi-Layer System
Surface plasmon is a charge density wave on the surface of metals. The surface plasmon resonance technique is relatively new, and it is one of the most sensitive techniques to probe surface and interface effects. The Fresnel's equations and Snell's law are used to compute the reflection...
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| 格式: | Thesis |
| 语言: | English English |
| 出版: |
2000
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| 主题: | |
| 在线阅读: | http://psasir.upm.edu.my/id/eprint/9554/1/FSAS_2000_8.pdf |
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| 总结: | Surface plasmon is a charge density wave on the surface of metals. The
surface plasmon resonance technique is relatively new, and it is one of the
most sensitive techniques to probe surface and interface effects. The Fresnel's
equations and Snell's law are used to compute the reflection and transmittance
of light incident on multilayers (series of N layers and N+ 1 interfaces)
between semi-infinite ambient and substrate media. The effects of multiple
reflection are taken care of by using 2 x 2 scattering matrix techniques. A plot
of a graph for reflectance and transmittance can be obtained by varying the
incident angle of a light beam at fixed frequency, or by varying the
wavelength. Various plots of reflectance and transmittance as a function of
incident angle, wavelength and interface parameters are displayed. The Visual Basic 5.0 standard edition was used in this project whereby a window-based
program with graphic user interface (QUI) was developed for the simulation of
reflectance and transmittance. After the software program was developed, it
was tested with four simulations with well-known experimental results to
ascertain the reliability of the simulations. Some of the optical experiments for
the both sections of program namely; the reflection and transmission versus
incident angle and versus wavelength were simulated. These simulations were
studied with Krestchmann's and Otto's configurations. The effect of variation
of thickness, dielectric constants, incident angles and wavelengths were
demonstrated. Based on the above simulation results, it can be concluded that
the program is general enough and it can be used to simulate reflectance and
transmittance for any materials. |
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