20-Gbps High-Speed Converged I/O Loop Back Test Design Methodology For Signal Integrity
Enhancement

20-Gbps High-Speed Converged I/O Loop Back Test Design Methodology For Signal Integrity Enhancement

In high-volume manufacturing (HVM), the degradations of signals at high speed and high frequencies will affect test results. In the semiconductor field, inaccuracies of test setup impact a product yield, increase test operating cost and delay products release time. With the demand for rapid improve...

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书目详细资料
主要作者:	Shanmugam, Ragubalan
格式:	Thesis
语言:	English
出版:	2015
主题:	TK7800-8360 Electronics
在线阅读:	http://eprints.usm.my/41327/1/RAGUBALAN_AL_SHANMUGAM_24_Pages.pdf
标签:	添加标签没有标签, 成为第一个标记此记录!

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