Fabrication And Physical Characterisation Of Zinc Oxide Thin Films

Zinc oxide (ZnO) thin films were deposited on α-0001 sapphire substrates using direct current (d.c.) magnetron sputtering process and annealed at various temperatures in an inert atmosphere to investigate its effect on the ultraviolet (UV) emission, stress, lattice constants, crystallite size as wel...

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Main Author:	Lim , Yam Tee
Format:	Thesis
Language:	English
Published:	2012
Subjects:	LC5800-5808 Distance education.
Online Access:	http://eprints.usm.my/41953/1/LIM_YAM_TEE.pdf
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id	my-usm-ep.41953
record_format	uketd_dc
spelling	my-usm-ep.419532019-04-12T05:26:23Z Fabrication And Physical Characterisation Of Zinc Oxide Thin Films 2012-03 Lim , Yam Tee LC5800-5808 Distance education. Zinc oxide (ZnO) thin films were deposited on α-0001 sapphire substrates using direct current (d.c.) magnetron sputtering process and annealed at various temperatures in an inert atmosphere to investigate its effect on the ultraviolet (UV) emission, stress, lattice constants, crystallite size as well as the possibility of inducing nanostructure growth. Scanning electron microscope (SEM) and X-ray diffraction (XRD) found that ZnO thin films have a fairly uniform granular surface structure with a preferential c-axis growth direction. 2012-03 Thesis http://eprints.usm.my/41953/ http://eprints.usm.my/41953/1/LIM_YAM_TEE.pdf application/pdf en public masters Universiti Sains Malaysia Pusat Pengajian Pendidikan Jarak Jauh
institution	Universiti Sains Malaysia
collection	USM Institutional Repository
language	English
topic	LC5800-5808 Distance education.
spellingShingle	LC5800-5808 Distance education. Lim , Yam Tee Fabrication And Physical Characterisation Of Zinc Oxide Thin Films
description	Zinc oxide (ZnO) thin films were deposited on α-0001 sapphire substrates using direct current (d.c.) magnetron sputtering process and annealed at various temperatures in an inert atmosphere to investigate its effect on the ultraviolet (UV) emission, stress, lattice constants, crystallite size as well as the possibility of inducing nanostructure growth. Scanning electron microscope (SEM) and X-ray diffraction (XRD) found that ZnO thin films have a fairly uniform granular surface structure with a preferential c-axis growth direction.
format	Thesis
qualification_level	Master's degree
author	Lim , Yam Tee
author_facet	Lim , Yam Tee
author_sort	Lim , Yam Tee
title	Fabrication And Physical Characterisation Of Zinc Oxide Thin Films
title_short	Fabrication And Physical Characterisation Of Zinc Oxide Thin Films
title_full	Fabrication And Physical Characterisation Of Zinc Oxide Thin Films
title_fullStr	Fabrication And Physical Characterisation Of Zinc Oxide Thin Films
title_full_unstemmed	Fabrication And Physical Characterisation Of Zinc Oxide Thin Films
title_sort	fabrication and physical characterisation of zinc oxide thin films
granting_institution	Universiti Sains Malaysia
granting_department	Pusat Pengajian Pendidikan Jarak Jauh
publishDate	2012
url	http://eprints.usm.my/41953/1/LIM_YAM_TEE.pdf
_version_	1747821003696766976

Fabrication And Physical Characterisation Of Zinc Oxide Thin Films

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