An Optical Set-Up For Inspecting Edge Chipping Defects Of Dws Solar Wafer
Diamond-Wire Sawn (DWS) technique in Photovoltaic (PV) wafer slicing has the capability to slice out thinner wafers at a faster speed and lower kerf lost. However, thinner wafers will cause higher breakage rate. In-line inspection of defects such as wafer’s edge chipping has become more important...
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| Main Author: | |
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| Format: | Thesis |
| Language: | English |
| Published: |
2019
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| Subjects: | |
| Online Access: | http://eprints.usm.my/50617/1/An%20Optical%20Set-Up%20For%20Inspecting%20Edge%20Chipping%20Defects%20Of%20Dws%20Solar%20Wafer.pdf |
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