Investigation On Vision Lead Over Rejection For D-PAK Package At Testing Operation Using Seven Quality Control Tools

In semiconductor industries, it as a common problem for the manufacture to falsely reject good product, part or component in their production lines due to error measurement of their vision inspection system. This scenario is very costly to the manufacturers in term of cycle time, scrap and delivery...

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Bibliographic Details
Main Author: Semposothy, Sevasothy
Format: Thesis
Language:English
English
Published: 2017
Subjects:
Online Access:http://eprints.utem.edu.my/id/eprint/22399/1/Investigation%20On%20Vision%20Lead%20Over%20Rejection%20For%20D-PAK%20Package%20At%20Testing%20Operation%20Using%20Seven%20Quality%20Control%20Tools%20-%20Sevasothy%20Semposothy%20-%2024%20Pages.pdf
http://eprints.utem.edu.my/id/eprint/22399/2/Investigation%20On%20Vision%20Lead%20Over%20Rejection%20For%20D-PAK%20Package%20At%20Testing%20Operation%20Using%20Seven%20Quality%20Control%20Tools%20-%20Sevasothy%20Semposothy.pdf
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