Investigation On Vision Lead Over Rejection For D-PAK Package At Testing Operation Using Seven Quality Control Tools
In semiconductor industries, it as a common problem for the manufacture to falsely reject good product, part or component in their production lines due to error measurement of their vision inspection system. This scenario is very costly to the manufacturers in term of cycle time, scrap and delivery...
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Main Author: | Semposothy, Sevasothy |
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Format: | Thesis |
Language: | English English |
Published: |
2017
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Subjects: | |
Online Access: | http://eprints.utem.edu.my/id/eprint/22399/1/Investigation%20On%20Vision%20Lead%20Over%20Rejection%20For%20D-PAK%20Package%20At%20Testing%20Operation%20Using%20Seven%20Quality%20Control%20Tools%20-%20Sevasothy%20Semposothy%20-%2024%20Pages.pdf http://eprints.utem.edu.my/id/eprint/22399/2/Investigation%20On%20Vision%20Lead%20Over%20Rejection%20For%20D-PAK%20Package%20At%20Testing%20Operation%20Using%20Seven%20Quality%20Control%20Tools%20-%20Sevasothy%20Semposothy.pdf |
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