Optimization of vhf-pecvd deposition parameters for silicon carbide film using in-situ and in-line gas phase analysis
In this study, the feasibility of using very high frequency (100 MHz to 200 MHz) Plasma Enhanced Chemical Vapour Deposition (VHF-PECVD) technique to deposit crystalline silicon carbide (SiC) thin films was investigated. High quality crystalline SiC film is very challenging to be produced since high...
محفوظ في:
المؤلف الرئيسي: | Azali, Muhamad Muizzudin |
---|---|
التنسيق: | أطروحة |
اللغة: | English |
منشور في: |
2022
|
الموضوعات: | |
الوصول للمادة أونلاين: | http://eprints.utm.my/102659/1/MuhamadMuizzudinAzaliMFS2022.pdf.pdf |
الوسوم: |
إضافة وسم
لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!
|
مواد مشابهة
-
Comparison of the structural properties of silicon carbide using very high frequency plasma enhanced chemical vapour deposition with magnetron sputtering techniques
بواسطة: Azali, Muhamad Muizzudin
منشور في: (2022) -
Structural and optical properties of nanocrystalline silicon thin films grown by 150MHz VHF-PECVD
بواسطة: Tarjudin, Nurul Aini
منشور في: (2012) -
Development of very high frequency plasma enhanced chemical vapour deposition for nanostructure silicon carbide thin film deposition
بواسطة: Omar, Muhammad Firdaus
منشور في: (2016) -
UV-Vis characterization of diamond-like carbon thin films deposited using (DC-PECVD)
بواسطة: Ab. Rahman, Nur Alifah
منشور في: (2010) -
Structural properties of hydrogenated amorphous silicon (A-SI:H) thin film grown via radio frequency plasma enhanced chemical vapor deposition (RF PECVD)
بواسطة: Anthony Hasbi, Hasbullah
منشور في: (2005)