Enhanced configurable 2-d linear feedback shift register with maximal length

Integrated circuit (IC) testing is one of the important steps in IC manufacturing. In IC testing, various methods have been developed to generate test patterns for testing purposes. Linear feedback shift register (LFSR) is one of the famous methods with easy implementation and uses little gate count...

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Main Author:	Wong, Kue Fong
Format:	Thesis
Published:	2011
Subjects:	TK Electrical engineering Electronics Nuclear engineering
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id	my-utm-ep.32056
record_format	uketd_dc
spelling	my-utm-ep.320562020-11-05T01:14:01Z Enhanced configurable 2-d linear feedback shift register with maximal length 2011-05 Wong, Kue Fong TK Electrical engineering. Electronics Nuclear engineering Integrated circuit (IC) testing is one of the important steps in IC manufacturing. In IC testing, various methods have been developed to generate test patterns for testing purposes. Linear feedback shift register (LFSR) is one of the famous methods with easy implementation and uses little gate counts. However, LFSR is only able to generate pseudo random patterns which do not have the capability to detect random resistant faults. Some research papers have proposed to use the modified 2-D LFSR to generate deterministic patterns. However, 2-D LFSR has limitation to generate long test patterns, which leads to the proposal of another BIST called configurable 2-D LFSR to overcome this issue. In this project, we propose an enhanced configurable 2-D LFSR with maximal length and capable of generating both deterministic and pseudo random patterns. The new design of enhanced configurable 2-D LFSR with maximal length have similar fault coverage with less hardware overhead compare with traditional configurable 2-D LFSR. This project also compares the effectiveness of the 2-D LFSR, configurable 2-D LFSR and enhanced configurable 2-D LFSR with maximal length and proposed to use a split-able maximal LFSR to further reduce test time. In conclusion, this new enhanced BIST circuit has similar fault coverage and less hardware overhead compared with traditional configurable 2-D LFSR. This proved that it successfully met the project objective. 2011-05 Thesis http://eprints.utm.my/id/eprint/32056/ masters Universiti Teknologi Malaysia, Faculty of Electrical Engineering Faculty of Electrical Engineering
institution	Universiti Teknologi Malaysia
collection	UTM Institutional Repository
topic	TK Electrical engineering Electronics Nuclear engineering
spellingShingle	TK Electrical engineering Electronics Nuclear engineering Wong, Kue Fong Enhanced configurable 2-d linear feedback shift register with maximal length
description	Integrated circuit (IC) testing is one of the important steps in IC manufacturing. In IC testing, various methods have been developed to generate test patterns for testing purposes. Linear feedback shift register (LFSR) is one of the famous methods with easy implementation and uses little gate counts. However, LFSR is only able to generate pseudo random patterns which do not have the capability to detect random resistant faults. Some research papers have proposed to use the modified 2-D LFSR to generate deterministic patterns. However, 2-D LFSR has limitation to generate long test patterns, which leads to the proposal of another BIST called configurable 2-D LFSR to overcome this issue. In this project, we propose an enhanced configurable 2-D LFSR with maximal length and capable of generating both deterministic and pseudo random patterns. The new design of enhanced configurable 2-D LFSR with maximal length have similar fault coverage with less hardware overhead compare with traditional configurable 2-D LFSR. This project also compares the effectiveness of the 2-D LFSR, configurable 2-D LFSR and enhanced configurable 2-D LFSR with maximal length and proposed to use a split-able maximal LFSR to further reduce test time. In conclusion, this new enhanced BIST circuit has similar fault coverage and less hardware overhead compared with traditional configurable 2-D LFSR. This proved that it successfully met the project objective.
format	Thesis
qualification_level	Master's degree
author	Wong, Kue Fong
author_facet	Wong, Kue Fong
author_sort	Wong, Kue Fong
title	Enhanced configurable 2-d linear feedback shift register with maximal length
title_short	Enhanced configurable 2-d linear feedback shift register with maximal length
title_full	Enhanced configurable 2-d linear feedback shift register with maximal length
title_fullStr	Enhanced configurable 2-d linear feedback shift register with maximal length
title_full_unstemmed	Enhanced configurable 2-d linear feedback shift register with maximal length
title_sort	enhanced configurable 2-d linear feedback shift register with maximal length
granting_institution	Universiti Teknologi Malaysia, Faculty of Electrical Engineering
granting_department	Faculty of Electrical Engineering
publishDate	2011
_version_	1747815910681346048

Enhanced configurable 2-d linear feedback shift register with maximal length

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