Enhanced configurable 2-d linear feedback shift register with maximal length
Integrated circuit (IC) testing is one of the important steps in IC manufacturing. In IC testing, various methods have been developed to generate test patterns for testing purposes. Linear feedback shift register (LFSR) is one of the famous methods with easy implementation and uses little gate count...
Saved in:
Main Author: | Wong, Kue Fong |
---|---|
Format: | Thesis |
Published: |
2011
|
Subjects: | |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Design of enhanced non exclusive XOR test of 2-D linear feedback shift register
by: Wong, Shin Guey
Published: (2010) -
An Improved Linear Feedback Shift Register (LFSR- based) Stream Cipher Generator
by: Mahdi, Reyadh H
Published: (2009) -
Simulation of linear feedback control of D-STATCOM for voltage sag mitigation
by: Zulkifli, Shamsul Aizam
Published: (2005) -
Design for testability method at register transfer level
by: Paraman, Norlina
Published: (2016) -
Framework for multistage pre-treatment of anaerobic digestion for maximizing electrical energy production
by: Raheem, Abdur
Published: (2018)