APA (7th ed.) Citation

Alawey, S. Z. (2014). Gate oxide short (gos) defect modeling based on 32 nm CMOS process.

Chicago Style (17th ed.) Citation

Alawey, Sahar Z. Gate Oxide Short (gos) Defect Modeling Based on 32 Nm CMOS Process. 2014.

MLA (8th ed.) Citation

Alawey, Sahar Z. Gate Oxide Short (gos) Defect Modeling Based on 32 Nm CMOS Process. 2014.

Warning: These citations may not always be 100% accurate.