Software-based self-testing for a risc processor

Software-based self-testing (SBST) has been touted as the effective way to test the processors effectively, with reasonable test coverage, plus the advantages of at-speed testing, and without performance degradation in terms of area and power. Previous work has been done on combining SBST with parti...

وصف كامل

محفوظ في:
التفاصيل البيبلوغرافية
المؤلف الرئيسي: Teh, Wee Meng
التنسيق: أطروحة
اللغة:English
منشور في: 2014
الموضوعات:
الوصول للمادة أونلاين:http://eprints.utm.my/id/eprint/48617/1/TehWeeMengMFKE2014.pdf
الوسوم: إضافة وسم
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spelling my-utm-ep.486172020-03-02T07:24:04Z Software-based self-testing for a risc processor 2014 Teh, Wee Meng QA76 Computer software Software-based self-testing (SBST) has been touted as the effective way to test the processors effectively, with reasonable test coverage, plus the advantages of at-speed testing, and without performance degradation in terms of area and power. Previous work has been done on combining SBST with partial scan logic insertion at Register Transfer Language (RTL) level for a 16-bit RISC processor design. In this project, focus will be done on test coverage improvement without the use of scan logic. 2014 Thesis http://eprints.utm.my/id/eprint/48617/ http://eprints.utm.my/id/eprint/48617/1/TehWeeMengMFKE2014.pdf application/pdf en public http://dms.library.utm.my:8080/vital/access/manager/Repository/vital:82137?queryType=vitalDismax&query=Software-based+self-testing+for+a+risc+processor&public=true masters Universiti Teknologi Malaysia, Faculty of Electrical Engineering Faculty of Electrical Engineering
institution Universiti Teknologi Malaysia
collection UTM Institutional Repository
language English
topic QA76 Computer software
spellingShingle QA76 Computer software
Teh, Wee Meng
Software-based self-testing for a risc processor
description Software-based self-testing (SBST) has been touted as the effective way to test the processors effectively, with reasonable test coverage, plus the advantages of at-speed testing, and without performance degradation in terms of area and power. Previous work has been done on combining SBST with partial scan logic insertion at Register Transfer Language (RTL) level for a 16-bit RISC processor design. In this project, focus will be done on test coverage improvement without the use of scan logic.
format Thesis
qualification_level Master's degree
author Teh, Wee Meng
author_facet Teh, Wee Meng
author_sort Teh, Wee Meng
title Software-based self-testing for a risc processor
title_short Software-based self-testing for a risc processor
title_full Software-based self-testing for a risc processor
title_fullStr Software-based self-testing for a risc processor
title_full_unstemmed Software-based self-testing for a risc processor
title_sort software-based self-testing for a risc processor
granting_institution Universiti Teknologi Malaysia, Faculty of Electrical Engineering
granting_department Faculty of Electrical Engineering
publishDate 2014
url http://eprints.utm.my/id/eprint/48617/1/TehWeeMengMFKE2014.pdf
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