Defectivity improvement in advanced processes and its investigation to negative bias temperature instabilities in High-K/Metal-Gate Deep-Submicron CMOS /

Defectivity improvement in advanced processes and its investigation to negative bias temperature instabilities in High-K/Metal-Gate Deep-Submicron CMOS /

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Bibliographic Details
Main Author: Yasmin Abdul Wahab (Author)
Format: Thesis Book
Language:English
Published: 2015
Subjects:
Metal oxide semiconductors, Complementary > Testing
Electroplating chemicals.
Integrated circuits > Very large scale integration.
Very high speed integrated circuits
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