Yasmin Abdul Wahab. (2015). Defectivity improvement in advanced processes and its investigation to negative bias temperature instabilities in High-K/Metal-Gate Deep-Submicron CMOS.
Chicago Style (17th ed.) CitationYasmin Abdul Wahab. Defectivity Improvement in Advanced Processes and Its Investigation to Negative Bias Temperature Instabilities in High-K/Metal-Gate Deep-Submicron CMOS. 2015.
MLA (8th ed.) CitationYasmin Abdul Wahab. Defectivity Improvement in Advanced Processes and Its Investigation to Negative Bias Temperature Instabilities in High-K/Metal-Gate Deep-Submicron CMOS. 2015.
Warning: These citations may not always be 100% accurate.