Electron beam testing of integrated circuits using a modified scanning electron microscope /

Electron beam testing of integrated circuits using a modified scanning electron microscope /

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書目詳細資料
主要作者:	Sim, Kian Sin
格式:	Thesis 圖書
語言:	English
出版:	1990.
主題:	Probes (Electronic instruments) Integrated circuits > Very large scale integration > Testing.
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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