Electron beam testing of integrated circuits using a modified scanning electron microscope /

Electron beam testing of integrated circuits using a modified scanning electron microscope /

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书目详细资料
主要作者:	Sim, Kian Sin
格式:	Thesis 图书
语言:	English
出版:	1990.
主题:	Probes (Electronic instruments) Integrated circuits > Very large scale integration > Testing.
标签:	添加标签没有标签, 成为第一个标记此记录!

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