Numerical and experimental studies of backgating in high electron mobility transistors /

Numerical and experimental studies of backgating in high electron mobility transistors /

Saved in:

书目详细资料
主要作者:	Lee, Kin Man
格式:	Thesis 图书
语言:	English
出版:	1995.
主题:	Modulation-doped field-effect transistors Field-effect transistors.
标签:	添加标签没有标签, 成为第一个标记此记录!

相似书籍

New techniques for the characterization of hot-carrier degradation in MOS devices /
由: Leang, Sern Ee
出版: (1997)

Characterization of hot-carrier degradation in submicrometer MOS transistors /
由: Ang, Diing Shenp
出版: (1997)

Performance of 7NM strained finfet of different channel material based on geometrical properties /
由: Fatin Nur Nadzirah Azhari
出版: (2016)

Hot-carrier characterization of submicrometer MOS transistors : subthreshold degradation and channel-width effect /
由: Qin, Wei Han
出版: (1998)

The effect of doping concentration on the characteristics of n-channel MOSFET /
由: Teen, Soh Hong
出版: (2005)

Extraction of submicron mosfet parameters /
由: Seah, Kah Suan
出版: (1997)

Fabrication and characterization of microfluidic field effect transistor on silicon substrate
由: Maizatul, Zolkapli

Integration of substrate-gate couple p-type anatase TiO₂ for field-effect transistor based biosensors

Hot-carrier studies in submicrometer SOI and conventional MOSFETs /
由: Yip, Anselm
出版: (1998)

A study of hot-carrier degradation in nitrided and conventional oxides /
由: Goo, Kah Heong
出版: (1998)

Hot-carrier degradation study in MOSFET's by charge pumping, gated-diode and floating gate techniques /
由: Goh, Yong Han
出版: (1997)

Junctionless transistors: parametric study with conventional doping in MOSFETS

Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements /
由: Tan, Suat Eng
出版: (1997)

Simulation of charge-trapping in nano-scale mosfets in the presence of random-dopants-induced variability /
由: Muhammad Faiz Bukhori
出版: (2011)

The lateral profiling of interface state and oxide charge densities in electrically stressed MOSFET's /
由: Hoon, Siew Kuok
出版: (1998)

Hot-carrier effects in thin gate oxide MOSFET's /
由: See, Leng Kian
出版: (1998)

Integration of nanoporous structure into vertical organic field effect transistor /
由: Muhammad Zharfan Mohd Halizan
出版: (2018)

Development of empirical potential profile model for unusual energy separation of subbands in inidium-absorbed Si(111) inversion layer /
由: Nur Idayu binti Ayob
出版: (2015)

Carrier lifetime characterization techniques in SOI and bulk silicon /
由: Cheng, Zhiyuan
出版: (1999)

Kajian tentang ciri-ciri elektrik transistor elektron kelincahan tinggi pseudomorfik (PHEMT) dalam regim nano /
由: Khairul Nisha Mohd. Kharuddin
出版: (2006)

A study on the impact of processing parameters on low-voltage power MOSFET /
由: Nur Aqilah Othman
出版: (2012)

Vanadyl tetrabutyltetrakis (dimethylamino) phthalocyanine based thin films for organic sensor and transistor applications /
由: Nur Adilah Roslan
出版: (2020)

Nonlinear identification of steam distillation pilot plant / Haslizamri Md Shariff
由: Md Shariff, Haslizamri
出版: (2015)

Design and construction of charge pumping technique for MOS transistor characterization /
由: Lee, Hock Guan
出版: (2004)

CMOS compatible vertical surround gate mosfets with reduced parasitics /
由: Kunz, Veit Dominik
出版: (2003)

Noise characterization of polysilicon emitter bipolar transistors /
由: Syed Shahzad Shah
出版: (1994)

Optimization and characterization of 130 Nm CMOS transistor design using TCAD simulation /
由: Hani Noorashiqin Abd Majid
出版: (2007)

Latent damage generation in silicon dioxide under high-field impulse and constant-bias stressing /
由: Lim, Peng Soon
出版: (2001)

Kesan sepuhlindap ke atas ciri elektrik sentuhan Ohmik dan Schottky untuk peranti transistor elektron berkelincahan tinggi (HEMTs) /
由: Asban Dolah

Heterojunction bipolar transistor (HBT) for high power applications /
由: Heng, Chun Huat
出版: (1998)

Pencampur PHEMT GaAs untuk aplikasi pada 28 GHz dan berjalur lebar /
由: Nuriha Abd. Rahman
出版: (2004)

A study of hot carrier degradation in LDMOS transistor /
由: Atikah Razi
出版: (2013)

Ion selectivity studies using supervised neural network for ion-sensitive field-effect transistor sensor /
由: Wan Fazlida Hanim Abdullah
出版: (2011)

Impact of fabrication process on hot carrier injection in VDMOS transistor /
由: Murti, Wijaya Bayu
出版: (2013)

Fault tolerance of L1 data cache memory induced by intrinsic parameters fluctuation in sub 10nm UTB-SOI MOSFETs
由: Ahmed, Rabah Abood
出版: (2013)

Two-dimensional analytical modelling of the short-channel mosfet /
由: Kendall, James D. 1959-
出版: (1987)

Performance of advanced-process and multi-gated mosfets based on geometric and process design considerations /
由: Fazliyatul Azwa Md Rezali
出版: (2017)

Degradation analysis based on design considerations of advanced-process MOSFET /
由: Ainul Fatin Muhammad Alimin
出版: (2018)

Electrical characterization of bulk traps and interface traps in the fully-depleted SOI MOSFET /
由: Lun, Zhao
出版: (2002)

Analytic methods for timing analysis of interconnects in CMOS very large scale integrated circuits /
由: Yong, Alan Kuen Fatt
出版: (1997)

Services hosted by the Perpustakaan Sultan Abdul Samad, Universiti Putra Malaysia with Cooperation MySyL Group