A correlation of oxide trap density and TDDB characteristics of very thin SiO2 films /

A correlation of oxide trap density and TDDB characteristics of very thin SiO2 films /

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書目詳細資料
主要作者:	Perera, Merinnage Tamara Chandima
格式:	圖書
語言:	English
出版:	1995.
主題:	Thin films > Electric properties Silicon oxide films Metal oxide semiconductors.
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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