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Perera, Merinnage Tamara Chandima
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Perera, Merinnage Tamara Chandima
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A correlation of oxide trap density and TDDB characteristics of very thin SiO2 films /
by
Perera
,
Merinnage
Tamara
Chandima
Published 1995
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Related Subjects
Electric properties
Metal oxide semiconductors
Silicon oxide films
Thin films
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