在您的搜尋 主題建議
Showing 1 - 20 results of 26 for search '', 查詢時間: 0.02s Refine Results
  1. 1
    Bimetallic oxide derived from metal organic framework (MOF) as potential electrode materials for supercapacitor /
    由 Farah Juliana Juni
    出版 2021
    索引號: 載入...
     位於: 載入...
    獲取全文
    Thesis 圖書
    加到收藏夾
    Saved in:
  2. 2
    Study of Schottky and Poole-Frenkel conduction mechanism in Fe304-gamma-Fe2O3/SiO2/n-type Si system /
    由 Chung, Adrian Ning Hann
    出版 2021
    獲取全文
    Thesis 圖書
    加到收藏夾
    Saved in:
  3. 3
    Electron beam induced current/tunneling current microscopy of thin silicon dioxide films on silicon /
    由 Pey, Kin San
    出版 1994
    Thesis 圖書
    加到收藏夾
    Saved in:
  4. 4
    A comparative study of MOS capacitors fabricated on single-crystal and polycrystalline silicon /
    由 Tay, Tuang Mee
    出版 1990
    Thesis 圖書
    加到收藏夾
    Saved in:
  5. 5
    Modelling and simulation of hot-carrier degradation in submicrometre MOS transistors /
    由 Seah, Boon Pian
    出版 1995
    Thesis 圖書
    加到收藏夾
    Saved in:
  6. 6
    The influence of a layer of oxide on electromigration performance of Al/Cu/Si metal lines /
    由 Koh, David Khar Ann
    出版 1995
    Thesis 圖書
    加到收藏夾
    Saved in:
  7. 7
    Electrical characterisation of MOS gate oxide /
    由 Ooi, Joo Aik
    出版 1996
    Thesis 圖書
    加到收藏夾
    Saved in:
  8. 8
    Tunnelling phenomena in rapid thermal annealed silicon : silicon oxide systems /
    由 Poon, Fook Weng
    出版 1997
    Thesis 圖書
    加到收藏夾
    Saved in:
  9. 9
    Hot-carrier characterization of tungsten polycide gate and graded-junction MOS transistors /
    由 Lou, Choon Leong
    出版 1997
    Thesis 圖書
    加到收藏夾
    Saved in:
  10. 10
    Development of empirical potential profile model for unusual energy separation of subbands in inidium-absorbed Si(111) inversion layer /
    由 Nur Idayu binti Ayob
    出版 2015
    Thesis
    加到收藏夾
    Saved in:
  11. 11
    A correlation of oxide trap density and TDDB characteristics of very thin SiO2 films /
    圖書
    加到收藏夾
    Saved in:
  12. 12
    Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /
    Thesis 圖書
    加到收藏夾
    Saved in:
  13. 13
    Fabrikasi sensor tekanan kapasitif sangat rendah (STKSR) menggunakan teknologi proses piawai CMOS /
    由 Muhammad Ramdzan Buyong
    出版 2010
    Thesis 圖書
    加到收藏夾
    Saved in:
  14. 14
    Characterizing the channel interface properties of vertical double-diffused metal-oxide semiconductor (DMOS) with charge pumping method /
    Thesis 圖書
    加到收藏夾
    Saved in:
  15. 15
    Formation of ZrO2 gate dielectric on Ge substrate by thermal oxidation and post annealing for metal-oxide-semiconductor devices /
    由 Lei, Zhen Ce
    出版 2019
    獲取全文
    Thesis 圖書
    加到收藏夾
    Saved in:
  16. 16
    Reliability investigation of MOS devices under high current impulse stressing /
    由 Teh, Gim Leong
    出版 1998
    Thesis 圖書
    加到收藏夾
    Saved in:
  17. 17
    Degradation and annealing of electrically-stressed thin oxide in MOS devices /
    由 Ng, Wee Thong
    出版 1998
    Thesis 圖書
    加到收藏夾
    Saved in:
  18. 18
    Effect of X-ray lithography on MOS device reliability /
    由 Kim, Sun Jung
    出版 2001
    Thesis 圖書
    加到收藏夾
    Saved in:
  19. 19
    A study of charge injection and removal in a floating gate ionisation- injection NOS [FIMOS] cell /
    由 Lee, Kok Choy
    出版 1987
    Thesis 圖書
    加到收藏夾
    Saved in:
  20. 20
    Optimization and characterization of 130 Nm CMOS transistor design using TCAD simulation /
    由 Hani Noorashiqin Abd Majid
    出版 2007
    獲取全文
    Thesis 圖書
    加到收藏夾
    Saved in:
檢索工具: 得到RSS訂閱 — 推薦此搜索 — 保存搜索