Investigation of hot-carrier-induced interface-traps by DCIV method /
Saved in:
主要作者: | Ng Kok Hooi |
---|---|
格式: | Thesis 图书 |
语言: | English |
出版: |
1999.
|
标签: |
添加标签
没有标签, 成为第一个标记此记录!
|
相似书籍
-
Investigation of hot-carrier degradation in surface and buried channel pmosfets/
由: Kok, Chee Kean
出版: (2000) -
Electrical characterization of bulk traps and interface traps in the fully-depleted SOI MOSFET /
由: Lun, Zhao
出版: (2002) -
A study of hot carrier degradation in LDMOS transistor /
由: Atikah Razi
出版: (2013) -
Impact of fabrication process on hot carrier injection in VDMOS transistor /
由: Murti, Wijaya Bayu
出版: (2013) -
Instrumentation development of an automated integrated test system (AITS) for the characterization of hot-carrier and oxide reliability /
由: Ng Tsu Hau
出版: (2000)