Morphologies and structures of hydrogen-terminated SI (111) surfaces studied by scanning tunneling microscopy and attenuated total reflection FTIR spectroscopy /

相似書籍

• In-situ and ex-situ attenuated total reflection ftir spectroscopic investigation of silicon surfaces hydrogenated in fluoride solutions /
  由: Wang, Li
  出版: (2001)
• Oxidation-induced stacking fault in (100) and (111) silicon wafers /
  由: Liang, Mei Keat
  出版: (2002)
• Forensic discrimination of black permanent marker pen inks using attenuated total reflection – fourier transform infrared spectroscopy (atr-ftir) with chemometrics procedure
  由: Joseph, Leviana Ferah
  出版: (2020)
• Transmission electron microscopy of microstructures produced in processing of silikon semiconductor devices /
  由: Jia, Yumin
  出版: (2001)
• STM investigation of Si magic cluster /
  由: Lee, Justina Sze Ying
  出版: (2000)