In-situ and ex-situ attenuated total reflection ftir spectroscopic investigation of silicon surfaces hydrogenated in fluoride solutions /

In-situ and ex-situ attenuated total reflection ftir spectroscopic investigation of silicon surfaces hydrogenated in fluoride solutions /

محفوظ في:

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	Wang, Li
التنسيق:	أطروحة كتاب
اللغة:	English
منشور في:	2001.
الوسوم:	إضافة وسم لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!

مواد مشابهة

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