A study of charge injection and removal in a floating gate ionisation- injection NOS [FIMOS] cell /

A study of charge injection and removal in a floating gate ionisation- injection NOS [FIMOS] cell /

محفوظ في:

التفاصيل البيبلوغرافية
المؤلف الرئيسي:	Lee, Kok Choy
التنسيق:	أطروحة كتاب
اللغة:	English
منشور في:	1987.
الموضوعات:	Semiconductor storage devices. Metal oxide semiconductors.
الوسوم:	إضافة وسم لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!

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