Characterization of pmosfet degradation in negative bias temperature instability test /

Characterization of pmosfet degradation in negative bias temperature instability test /

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書目詳細資料
主要作者:	Soon, Foo Yew (Author)
格式:	Thesis 圖書
語言:	English
出版:	2012.
主題:	Metal oxide semiconductor field-effect transistors. Metal oxide semiconductors, Complementary. Semiconductors. Microelectronics.
在線閱讀:	http://studentsrepo.um.edu.my/id/eprint/8383
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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