Showing
1 - 3
results of
3
for search '
'
Skip to content
Language
English
中文(简体)
中文(繁體)
اللغة العربية
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
Reset Filters
Collection:
Catalog
Institution:
Universiti Malaya
Suggested Topics:
Integrated circuits
AND
Testing
AND
Very large scale integration
Reset Filters
Show filters (5)
Collection:
Catalog
Institution:
Universiti Malaya
Suggested Topics:
Integrated circuits
AND
Testing
AND
Very large scale integration
Search Results
Suggested Topics within your search.
Suggested Topics within your search.
Integrated circuits
Testing
Very large scale integration
Electroplating chemicals
1
Metal oxide semiconductors, Complementary
1
Microprocessors
1
Probes (Electronic instruments)
1
Very high speed integrated circuits
1
Showing
1 - 3
results of
3
for search '
'
, query time: 0.01s
Refine Results
Sort
Relevance
Date Descending
Date Ascending
Call Number
Author
Title
1
A built-in self-testable bit-slice processor /
by
Ibrahim Abubakr M.
Published 1995
Call Number:
Loading...
Located:
Loading...
Get full text
Thesis
Book
Save to List
Saved in:
2
Electron beam testing of integrated circuits using a modified scanning electron microscope /
by
Sim, Kian Sin
Published 1990
Call Number:
Loading...
Located:
Loading...
Thesis
Book
Loading...
Save to List
Saved in:
3
Defectivity improvement in advanced processes and its investigation to negative bias temperature instabilities in High-K/Metal-Gate Deep-Submicron CMOS /
by
Yasmin Abdul Wahab
Published 2015
Call Number:
Loading...
Located:
Loading...
Thesis
Book
Loading...
Save to List
Saved in:
Search Tools:
Get RSS Feed
—
Email this Search
—
Save Search
Back
Narrow Search
Institution
Universiti Malaya
Collection
Catalog
Author
Ibrahim Abubakr M.
1
Sim, Kian Sin
1
Yasmin Abdul Wahab
1
Granting Institution
Universiti Malaya.
2
Language
English
3
PublishDate
From:
To:
Services hosted by the Perpustakaan Sultan Abdul Samad, Universiti Putra Malaysia with Cooperation MySyL Group
Loading...