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  1. 1
    A built-in self-testable bit-slice processor /
    by Ibrahim Abubakr M.
    Published 1995
    Subjects: “...Integrated circuits Very large scale integration Testing...”
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    Thesis Book
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  2. 2
    Defectivity improvement in advanced processes and its investigation to negative bias temperature instabilities in High-K/Metal-Gate Deep-Submicron CMOS /
    by Yasmin Abdul Wahab
    Published 2015
    Subjects: “...Integrated circuits Very large scale integration....”
    Thesis Book
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  3. 3
    Electron beam testing of integrated circuits using a modified scanning electron microscope /
    by Sim, Kian Sin
    Published 1990
    Subjects: “...Integrated circuits Very large scale integration Testing....”
    Thesis Book
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