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  1. 1
    Formation of ZrO2 gate dielectric on Ge substrate by thermal oxidation and post annealing for metal-oxide-semiconductor devices /
    by Lei, Zhen Ce
    Published 2019
    Subjects: “...Metal oxide semiconductors....”
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  2. 2
    Reliability investigation of MOS devices under high current impulse stressing /
    by Teh, Gim Leong
    Published 1998
    Subjects: “...Metal oxide semiconductors Reliability...”
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  3. 3
    Characterizing the channel interface properties of vertical double-diffused metal-oxide semiconductor (DMOS) with charge pumping method /
    Subjects: “...Silicon oxide....”
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  4. 4
    Optimization and characterization of 130 Nm CMOS transistor design using TCAD simulation /
    by Hani Noorashiqin Abd Majid
    Published 2007
    Subjects: “...Metal oxide semiconductor field-effect transistors....”
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  5. 5
    A correlation of oxide trap density and TDDB characteristics of very thin SiO2 films /
    Subjects: “...Silicon oxide films...”
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  6. 6
    A study of long and short channel NMOSFET on threshold voltage /
    by Norseha Ariffin
    Published 2013
    Subjects: “...Metal oxide semiconductor field-effect transistors....”
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  7. 7
    Degradation and annealing of electrically-stressed thin oxide in MOS devices /
    by Ng, Wee Thong
    Published 1998
    Subjects: “...Metal oxide semiconductors Deterioration...”
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  8. 8
    A study of hot carrier degradation in LDMOS transistor /
    by Atikah Razi
    Published 2013
    Subjects: “...Metal oxide semiconductors....”
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  9. 9
    Impact of fabrication process on hot carrier injection in VDMOS transistor /
    by Murti, Wijaya Bayu
    Published 2013
    Subjects: “...Metal oxide semiconductors....”
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  10. 10
    A study on hot carrier effect (HCE) on LDD n-MOSFET /
    by Haziezol Helmi Mohd Yusof
    Published 2013
    Subjects: “...Metal oxide semiconductors....”
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  11. 11
    Study of Schottky and Poole-Frenkel conduction mechanism in Fe304-gamma-Fe2O3/SiO2/n-type Si system /
    by Chung, Adrian Ning Hann
    Published 2021
    Subjects: “...Metal oxide semiconductors....”
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  12. 12
    Hot-carrier characterization of tungsten polycide gate and graded-junction MOS transistors /
    by Lou, Choon Leong
    Published 1997
    Subjects: “...Metal oxide semiconductors....”
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  13. 13
    A study on the effects of design parameters on PD SOI MOSFET /
    by Nurul Azimah Ahmad Arzaai
    Published 2013
    Subjects: “...Metal oxide semiconductors....”
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  14. 14
    A comparative study of MOS capacitors fabricated on single-crystal and polycrystalline silicon /
    by Tay, Tuang Mee
    Published 1990
    Subjects: “...Metal oxide semiconductors....”
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  15. 15
    Electrical characterisation of MOS gate oxide /
    by Ooi, Joo Aik
    Published 1996
    Subjects: “...Metal oxide semiconductors....”
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  16. 16
    Effect of X-ray lithography on MOS device reliability /
    by Kim, Sun Jung
    Published 2001
    Subjects: “...Metal oxide semiconductors....”
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  17. 17
    A study of charge injection and removal in a floating gate ionisation- injection NOS [FIMOS] cell /
    by Lee, Kok Choy
    Published 1987
    Subjects: “...Metal oxide semiconductors....”
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  18. 18
    Parameter optimization, characterization and adhesion strength of magnetron sputterred tisin coating /
    by Bushroa Abdul Razak
    Published 2012
    Subjects: “...Metal oxide semiconductors Materials....”
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  19. 19
    Tunnelling phenomena in rapid thermal annealed silicon : silicon oxide systems /
    by Poon, Fook Weng
    Published 1997
    Subjects: “...Metal oxide semiconductors....”
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  20. 20
    Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /
    Subjects: “...Metal oxide semiconductors Design and construction....”
    Thesis Book
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