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Defectivity improvement in advanced processes and its investigation to negative bias temperature instabilities in High-K/Metal-Gate Deep-Submicron CMOS /
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Yasmin Abdul Wahab
Published 2015
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Gate oxide integrity (GOI) for C13 (0.13 [micro]m) silicon processing technology /
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Yong, Yoong Hooi
Published 2006
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Yasmin Abdul Wahab
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Yong, Yoong Hooi
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