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  1. 1
    Gate oxide integrity (GOI) for C13 (0.13 [micro]m) silicon processing technology /
    by Yong, Yoong Hooi
    Published 2006
    Subjects: “...Metal oxide semiconductors, Complementary....”
    Thesis Book
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  2. 2
    Dielectric properties of a zener diode /
    by Azizan Ismail
    Published 1993
    Subjects: “...Diodes, Semiconductor....”
    Thesis Book
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