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Showing 1 - 13 results of 13 for search '"Semiconductor"', query time: 0.02s Refine Results
  1. 1
    Study on the conversion of wire material from gold to copper in semiconductor ball grid packaging /
    by Ronald Reegan Raipen
    Published 2012
    Subjects: “...Semiconductors Materials....”
    Thesis Book
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  2. 2
    Optical absorption studies of heavily doped silicon /
    by Aw, Siew Eng
    Published 1986
    Subjects: “...Semiconductors Testing Optical methods...”
    Thesis Book
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  3. 3
    Reliability investigation of MOS devices under high current impulse stressing /
    by Teh, Gim Leong
    Published 1998
    Subjects: “...Metal oxide semiconductors Reliability...”
    Thesis Book
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  4. 4
    Simulation framework of NBTI degradation in nano-scale p-mosfets from the perspective of hydrogen and non-hydrogen transport formalism /
    by Hanim Hussin
    Published 2015
    Subjects: “...Metal oxide semiconductor field-effect transistors Testing....”
    Thesis Book
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  5. 5
    Spreading resistance correction factor calculations /
    by Tan, Leng Seow
    Published 1980
    Subjects: “...Semiconductors Testing....”
    Thesis Book
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  6. 6
    Statistical analysis of wire-bond pull strength and accelerated stress-testing study /
    by Liu, Hao
    Published 1997
    Subjects: “...Semiconductors Bonding Testing...”
    Thesis Book
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  7. 7
    Study on mold compound conversion from glob material for semiconductor ball grid array packaging /
    by Prakash Babu Balakrishnan
    Published 2012
    Subjects: “...Semiconductors Materials Testing....”
    Thesis Book
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  8. 8
    A spectroscopic photoemission microscopy system for semiconductor device analysis /
    by Koh, Lian-Ser
    Published 1994
    Subjects: “...Semiconductors Testing Optical methods....”
    Thesis Book
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  9. 9
    Ultra shallow secondary ion mass spectrometric studies on semiconductors /
    by Ng, Chee Mang
    Published 2001
    Subjects: “...Semiconductors Characterization....”
    Thesis Book
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  10. 10
    An investigation into the electron beam induced current effects on semiconductor materials and devices /
    by Ong, Vincent Keng Sian
    Published 1995
    Subjects: “...Semiconductors Testing....”
    Thesis Book
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  11. 11
    Reliability of wire bonding in micro electronic packaging /
    by Ghazali Omar
    Published 1996
    Subjects: “...Semiconductors Bonding Testing....”
    Thesis Book
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  12. 12
    Gate oxide integrity (GOI) for C13 (0.13 [micro]m) silicon processing technology /
    by Yong, Yoong Hooi
    Published 2006
    Subjects: “...Metal oxide semiconductors, Complementary....”
    Thesis Book
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  13. 13
    Defectivity improvement in advanced processes and its investigation to negative bias temperature instabilities in High-K/Metal-Gate Deep-Submicron CMOS /
    by Yasmin Abdul Wahab
    Published 2015
    Subjects: “...Metal oxide semiconductors, Complementary Testing...”
    Thesis Book
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