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Showing 1 - 13 results of 13 for search '"Semiconductors"', 查詢時間: 0.02s Refine Results
  1. 1
    Study on the conversion of wire material from gold to copper in semiconductor ball grid packaging /
    由 Ronald Reegan Raipen
    出版 2012
    主題: “...Semiconductors Materials....”
    Thesis 圖書
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  2. 2
    Optical absorption studies of heavily doped silicon /
    由 Aw, Siew Eng
    出版 1986
    主題: “...Semiconductors Testing Optical methods...”
    Thesis 圖書
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  3. 3
    Reliability investigation of MOS devices under high current impulse stressing /
    由 Teh, Gim Leong
    出版 1998
    主題: “...Metal oxide semiconductors Reliability...”
    Thesis 圖書
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  4. 4
    Spreading resistance correction factor calculations /
    由 Tan, Leng Seow
    出版 1980
    主題: “...Semiconductors Testing....”
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  5. 5
    Statistical analysis of wire-bond pull strength and accelerated stress-testing study /
    由 Liu, Hao
    出版 1997
    主題: “...Semiconductors Bonding Testing...”
    Thesis 圖書
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  6. 6
    Study on mold compound conversion from glob material for semiconductor ball grid array packaging /
    由 Prakash Babu Balakrishnan
    出版 2012
    主題: “...Semiconductors Materials Testing....”
    Thesis 圖書
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  7. 7
    A spectroscopic photoemission microscopy system for semiconductor device analysis /
    由 Koh, Lian-Ser
    出版 1994
    主題: “...Semiconductors Testing Optical methods....”
    Thesis 圖書
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  8. 8
    Ultra shallow secondary ion mass spectrometric studies on semiconductors /
    由 Ng, Chee Mang
    出版 2001
    主題: “...Semiconductors Characterization....”
    Thesis 圖書
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  9. 9
    An investigation into the electron beam induced current effects on semiconductor materials and devices /
    由 Ong, Vincent Keng Sian
    出版 1995
    主題: “...Semiconductors Testing....”
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  10. 10
    Reliability of wire bonding in micro electronic packaging /
    由 Ghazali Omar
    出版 1996
    主題: “...Semiconductors Bonding Testing....”
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  11. 11
    Gate oxide integrity (GOI) for C13 (0.13 [micro]m) silicon processing technology /
    由 Yong, Yoong Hooi
    出版 2006
    主題: “...Metal oxide semiconductors, Complementary....”
    Thesis 圖書
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  12. 12
    Defectivity improvement in advanced processes and its investigation to negative bias temperature instabilities in High-K/Metal-Gate Deep-Submicron CMOS /
    由 Yasmin Abdul Wahab
    出版 2015
    主題: “...Metal oxide semiconductors, Complementary Testing...”
    Thesis 圖書
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  13. 13
    Simulation framework of NBTI degradation in nano-scale p-mosfets from the perspective of hydrogen and non-hydrogen transport formalism /
    由 Hanim Hussin
    出版 2015
    主題: “...Metal oxide semiconductor field-effect transistors Testing....”
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