Low area Programmable Memory Built-In Self-Test (PMBIST) for small embedded ram cores / Nur Qamarina Mohd Noor
As latest trend in designing processors and system-on-chips (SoCs) requires more RAMs than logics, these embedded RAMs contribute to the high percentage of yields for these processors and SoCs. To ensure high percentage of yield is achieved, a builtin self-test (BIST) is utilized to test these RAMs....
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| 格式: | Thesis |
| 语言: | English |
| 出版: |
2013
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| 在线阅读: | https://ir.uitm.edu.my/id/eprint/15565/1/TM_NUR%20QAMARINA%20MOHD%20NOOR%20EE%2013_5.PDF |
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